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溫度循環沖擊實驗機
簡要描述：
溫(wen)度(du)循(xun)環沖擊實驗機(ji)(ji)主(zhu)要適合用于電(dian)(dian)工(gong)電(dian)(dian)子電(dian)(dian)器機(ji)(ji)械等(deng)零(ling)組(zu)件、自動化(hua)零(ling)部件、防工(gong)業(ye)行業(ye)、航空航天研究所(suo)、兵工(gong)業(ye)、通訊產品(pin)或組(zu)件、汽車成品(pin)或配件、金屬材(cai)料、化(hua)學(xue)材(cai)料、五金塑料、LED、LCD光電(dian)(dian)、光伏、照明、BGA、PCB基扳、電(dian)(dian)子芯片IC、半導體陶磁及高分子材(cai)料之物理牲變化(hua),測試其材(cai)料對冷、熱(re)溫(wen)的快速反復(fu)抵(di)抗力及工(gong)業(ye)產品(pin)處于熱(re)脹(zhang)冷縮的環境時所(suo)出現的化(hua)學(xue)變化(hua)或者物理傷害，可確認工(gong)業(ye)
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發郵件給我們：apkjyzq@foxmail.com溫度循環沖擊實驗機主要(yao)適合用于(yu)電(dian)(dian)工(gong)電(dian)(dian)子電(dian)(dian)器機(ji)械(xie)等零組(zu)(zu)件、自(zi)動化(hua)零部件、防工(gong)業行(xing)業、航空航天研(yan)究所(suo)、兵(bing)工(gong)業、通訊產(chan)品(pin)或(huo)(huo)組(zu)(zu)件、汽車成品(pin)或(huo)(huo)配件、金屬材料(liao)、化(hua)學材料(liao)、五金塑料(liao)、LED、LCD光電(dian)(dian)、光伏、照明、BGA、PCB基扳、電(dian)(dian)子芯片IC、半導體(ti)陶磁及高分(fen)子材料(liao)之物理(li)牲變化(hua),測(ce)試(shi)其材料(liao)對(dui)冷(leng)、熱溫(wen)的(de)(de)(de)(de)快速(su)反復(fu)抵抗力(li)及工(gong)業產(chan)品(pin)處于(yu)熱脹冷(leng)縮(suo)的(de)(de)(de)(de)環境(jing)時所(suo)出現的(de)(de)(de)(de)化(hua)學變化(hua)或(huo)(huo)者物理(li)傷害，可確認工(gong)業產(chan)品(pin)的(de)(de)(de)(de)質量,從的(de)(de)(de)(de)IC到重(zhong)機(ji)械(xie)的(de)(de)(de)(de)組(zu)(zu)件，可作(zuo)為工(gong)業行(xing)業眾多產(chan)品(pin)改進品(pin)質的(de)(de)(de)(de)依(yi)據或(huo)(huo)參考(kao)。以便考(kao)核(he)產(chan)品(pin)的(de)(de)(de)(de)適應性或(huo)(huo)對(dui)測(ce)試(shi)產(chan)品(pin)的(de)(de)(de)(de)行(xing)為作(zuo)出評價。是新產(chan)品(pin)研(yan)發(fa)、樣機(ji)實(shi)驗(yan)、產(chan)品(pin)合格鑒(jian)定(ding)試(shi)驗(yan)過程*的(de)(de)(de)(de)重(zhong)要(yao)試(shi)驗(yan)手段(duan)。
溫度循環沖擊實驗機的型號與簡(jian)易參數：
沖(chong)擊(ji)試驗箱型號(hao) | AP-CJ-80 | AP-CJ-150 | AP-CJ-250 | AP-CJ-480 | ||
內(nei)箱(xiang)尺寸 | 50×40×40 | 60×50×50 | 70×60×60 | 80×80×75 | ||
外箱尺寸(cun)約（以(yi)實(shi)際尺寸為準） | 161×178×166 | 183×178×188 | 192×205×200 | 202×225×215 | ||
高箱儲存(cun)箱預熱(re)溫度范圍(wei) | -60℃～+200℃ | |||||
低(di)溫儲存箱預冷(leng)溫度范圍(wei) | -10℃～-55℃；-10℃～-65℃；-10℃～-75℃； | |||||
測試塑料產品可選(xuan)擇(ze)溫(wen)度范圍 | 高溫(wen)：RT～+150℃ | |||||
低溫：RT～-40℃；RT～-55℃；RT～-65℃； | ||||||
性能 | 溫度(du)穩定度(du) | ±2℃ | ||||
移動與歸復時間(jian) | 移(yi)動時間約10秒(miao)鐘，恢(hui)復時間約3~5 min | |||||
高箱(xiang)(xiang)儲存箱(xiang)(xiang)升溫(wen)時間 | ℃ | 150 | 150 | 150 | 150 | |
min | 40 | 40 | 40 | 40 | ||
高箱儲存(cun)箱降溫時間(jian) | ℃ | -55 -65 -75 | -55 -65 -75 | -55 -65 -75 | -55 -65 -75 | |
min | 70 80 90 | 80 90 100 | 90 100 110 | 100 110 120 | ||
滿足的標準有以下:
GB/T2423.1-2008 電工(gong)(gong)(gong)電子(zi)(zi)產(chan)(chan)品(pin)環(huan)境(jing)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan) 2部(bu)分試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)方法(fa) 試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)A 低(di)溫(wen)(wen);GJB360.7-87溫(wen)(wen)度沖擊試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan);GB/T 2423.2-2008 電工(gong)(gong)(gong)電子(zi)(zi)產(chan)(chan)品(pin)環(huan)境(jing)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan) 2部(bu)分:試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)方法(fa) 試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)B:高(gao)溫(wen)(wen);GB/T 10592 -2008 高(gao)低(di)溫(wen)(wen)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)技術條件(jian);GB/T 10589-2008 低(di)溫(wen)(wen)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)技術條件(jian);GB/T 11158-2008 高(gao)溫(wen)(wen)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)技術條件(jian);GB/T 2423.22-2002溫(wen)(wen)度變(bian)化(hua)(hua)(hua);GB/T 5170.1-2008 電工(gong)(gong)(gong)電子(zi)(zi)產(chan)(chan)品(pin)環(huan)境(jing)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)設備檢驗(yan)(yan)(yan)(yan)(yan)方法(fa) 總則;SJ/T10187-91Y73系(xi)列溫(wen)(wen)度變(bian)化(hua)(hua)(hua)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)——箱(xiang)式(shi)；SJ/T10186-91Y73系(xi)列溫(wen)(wen)度變(bian)化(hua)(hua)(hua)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)——二箱(xiang)式(shi);GB/T5170.2-2008 電工(gong)(gong)(gong)電子(zi)(zi)產(chan)(chan)品(pin)環(huan)境(jing)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)設備檢驗(yan)(yan)(yan)(yan)(yan)方法(fa) 溫(wen)(wen)度試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)設備;GB2424.1 電工(gong)(gong)(gong)電子(zi)(zi)產(chan)(chan)品(pin)環(huan)境(jing)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan) 高(gao)低(di)溫(wen)(wen)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)導則;GB/T 2424.13-2002試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)方法(fa)溫(wen)(wen)度變(bian)化(hua)(hua)(hua)試(shi)(shi)(shi)(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)導則