愛佩lcd屏高溫老化箱是臺可(ke)以模擬高溫(wen)(wen)(wen)及(ji)低(di)溫(wen)(wen)(wen)的(de)試驗(yan)(yan)設(she)(she)備(bei)，當(dang)然它還可(ke)以加(jia)入濕(shi)度功能(neng)做高低(di)溫(wen)(wen)(wen)交變(bian)濕(shi)熱(re)試驗(yan)(yan)，高低(di)溫(wen)(wen)(wen)試驗(yan)(yan)設(she)(she)備(bei)是指可(ke)以通過(guo)接電(dian)(dian)開(kai)啟電(dian)(dian)源(yuan)后(hou)可(ke)以隨意通過(guo)人工將(jiang)需要做的(de)高度、低(di)溫(wen)(wen)(wen)、高低(di)溫(wen)(wen)(wen)交變(bian)、高低(di)溫(wen)(wen)(wen)恒定的(de)時(shi)間、程序設(she)(she)定在控制器的(de)軟(ruan)件(jian)內，試驗(yan)(yan)設(she)(she)備(bei)即會按照人工所設(she)(she)定的(de)試驗(yan)(yan)條件(jian)走，包括(kuo)可(ke)以程序循環(huan)，自(zi)動(dong)停止工作或者故障報警等，就是在高溫(wen)(wen)(wen)和低(di)溫(wen)(wen)(wen)的(de)基礎上(shang)再加(jia)上(shang)濕(shi)熱(re)循環(huan)系統，使(shi)做高溫(wen)(wen)(wen)的(de)同(tong)時(shi)也可(ke)以加(jia)入濕(shi)度起恒溫(wen)(wen)(wen)恒濕(shi)測(ce)試，使(shi)試驗(yan)(yan)效(xiao)果(guo)更(geng)接近自(zi)然環(huan)境中現實的(de)氣候，模擬出更(geng)惡劣的(de)自(zi)然環(huan)境，從而使(shi)被試驗(yan)(yan)產品日后(hou)批量生產或者使(shi)用(yong)時(shi)性能(neng)會更(geng)加(jia)可(ke)靠(kao)及(ji)穩定。

愛佩lcd屏高溫老化箱是依(yi)據標準GB8897.4-200（idt IEC60086-4：2000）《原(yuan)電(dian)(dian)(dian)(dian)池(chi)(chi)4部分(fen)：鋰電(dian)(dian)(dian)(dian)池(chi)(chi)的(de)(de)安要(yao)求(qiu)》、GB8897.5-2006（idt IEC60086-5：2005）《原(yuan)電(dian)(dian)(dian)(dian)池(chi)(chi)5部分(fen)：水溶(rong)液(ye)電(dian)(dian)(dian)(dian)解質(zhi)(zhi)電(dian)(dian)(dian)(dian)池(chi)(chi)的(de)(de)安要(yao)求(qiu)》、IEC 62133：2002《堿性(xing)(xing)(xing)(xing)或其(qi)它非酸(suan)性(xing)(xing)(xing)(xing)電(dian)(dian)(dian)(dian)解液(ye)二次單(dan)體電(dian)(dian)(dian)(dian)池(chi)(chi)和(he)(he)電(dian)(dian)(dian)(dian)池(chi)(chi)組(zu)(zu)(zu)便攜(xie)(xie)式(shi)密(mi)(mi)封二次單(dan)體電(dian)(dian)(dian)(dian)池(chi)(chi)和(he)(he)電(dian)(dian)(dian)(dian)池(chi)(chi)組(zu)(zu)(zu)的(de)(de)安要(yao)求(qiu)》、IEC61951-2:2003《含堿性(xing)(xing)(xing)(xing)或其(qi)它非酸(suan)性(xing)(xing)(xing)(xing)電(dian)(dian)(dian)(dian)解質(zhi)(zhi)的(de)(de)便攜(xie)(xie)式(shi)密(mi)(mi)封可再充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)池(chi)(chi)和(he)(he)電(dian)(dian)(dian)(dian)池(chi)(chi)組(zu)(zu)(zu)2部分(fen):鎳金屬(shu)氫化物》、IEC61951-1：2003《含堿性(xing)(xing)(xing)(xing)或其(qi)它非酸(suan)性(xing)(xing)(xing)(xing)電(dian)(dian)(dian)(dian)解質(zhi)(zhi)的(de)(de)便攜(xie)(xie)式(shi)密(mi)(mi)封可再充電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)池(chi)(chi)和(he)(he)電(dian)(dian)(dian)(dian)池(chi)(chi)組(zu)(zu)(zu)1部分(fen):鎳鎘(ge)電(dian)(dian)(dian)(dian)池(chi)(chi)》、IEC 61960：2003《堿性(xing)(xing)(xing)(xing)或其(qi)它非酸(suan)性(xing)(xing)(xing)(xing)電(dian)(dian)(dian)(dian)解液(ye)二次單(dan)體電(dian)(dian)(dian)(dian)池(chi)(chi)和(he)(he)電(dian)(dian)(dian)(dian)池(chi)(chi)組(zu)(zu)(zu)便攜(xie)(xie)式(shi)二次鋰單(dan)體電(dian)(dian)(dian)(dian)池(chi)(chi)和(he)(he)電(dian)(dian)(dian)(dian)池(chi)(chi)組(zu)(zu)(zu)》、UL 1642：2006《鋰蓄電(dian)(dian)(dian)(dian)池(chi)(chi)組(zu)(zu)(zu)》進行(xing)熱濫用（溫(wen)）和(he)(he)熱沖擊試驗項目(mu)。

滿足標準(zhun)：

GB/T2423.1～2《電工電子產品的(de)基本環境(jing)試驗(yan)規程(cheng)試驗(yan)。A：低(di)溫試驗(yan)方法、試驗(yan)B：高溫試驗(yan)方法》.

GB/T10592-1989高低溫試驗(yan)箱技術條件.

GB/T10589-1989低溫(wen)試驗箱(xiang)技(ji)術條(tiao)件.

GB/ T 2421-1991《電(dian)工電(dian)子產品(pin)基本環境試驗規程 總則》.

GB/2423.34-86.MIL-STD883（方法1004.2）高低溫組合(he)循環試驗.

GB/T2423.4-93（MIL-STD810）方法507.2程序.

防(fang)爆等級：Exd Ⅱ BT4

GJB/150A-2009.實(shi)驗(yan)室環境試驗(yan)方法1部分(fen)