防(fang)爆高(gao)(gao)低溫試驗箱(xiang)均是在(zai)普通的試驗箱(xiang)里加(jia)裝了防(fang)爆功能(neng)的設備，如把內膽材料加(jia)厚，加(jia)裝防(fang)爆口(kou)等，常適用于易(yi)爆易(yi)燃產品做試驗，如蓄電(dian)池、鋰電(dian)池、鎘鎳(nie)電(dian)池、動力電(dian)池等產品做耐高(gao)(gao)溫、耐低溫、高(gao)(gao)低溫交變、高(gao)(gao)低溫循環、高(gao)(gao)低溫恒定等試驗或實驗。

防爆(bao)高低(di)溫(wen)試驗(yan)箱(xiang)均是依(yi)據標準GB8897.4-200（idt IEC60086-4：2000）《原電(dian)(dian)(dian)(dian)池4部分(fen)：鋰電(dian)(dian)(dian)(dian)池的安(an)要(yao)求(qiu)》、GB8897.5-2006（idt IEC60086-5：2005）《原電(dian)(dian)(dian)(dian)池5部分(fen)：水溶液(ye)電(dian)(dian)(dian)(dian)解(jie)(jie)質電(dian)(dian)(dian)(dian)池的安(an)要(yao)求(qiu)》、IEC 62133：2002《堿性(xing)或其它非(fei)酸(suan)性(xing)電(dian)(dian)(dian)(dian)解(jie)(jie)液(ye)二(er)(er)次單體電(dian)(dian)(dian)(dian)池和(he)電(dian)(dian)(dian)(dian)池組(zu)便(bian)攜(xie)式密封(feng)二(er)(er)次單體電(dian)(dian)(dian)(dian)池和(he)電(dian)(dian)(dian)(dian)池組(zu)的安(an)要(yao)求(qiu)》、IEC61951-2:2003《含(han)(han)堿性(xing)或其它非(fei)酸(suan)性(xing)電(dian)(dian)(dian)(dian)解(jie)(jie)質的便(bian)攜(xie)式密封(feng)可再充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)池和(he)電(dian)(dian)(dian)(dian)池組(zu)2部分(fen):鎳金屬氫化物(wu)》、IEC61951-1：2003《含(han)(han)堿性(xing)或其它非(fei)酸(suan)性(xing)電(dian)(dian)(dian)(dian)解(jie)(jie)質的便(bian)攜(xie)式密封(feng)可再充(chong)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)池和(he)電(dian)(dian)(dian)(dian)池組(zu)1部分(fen):鎳鎘電(dian)(dian)(dian)(dian)池》、IEC 61960：2003《堿性(xing)或其它非(fei)酸(suan)性(xing)電(dian)(dian)(dian)(dian)解(jie)(jie)液(ye)二(er)(er)次單體電(dian)(dian)(dian)(dian)池和(he)電(dian)(dian)(dian)(dian)池組(zu)便(bian)攜(xie)式二(er)(er)次鋰單體電(dian)(dian)(dian)(dian)池和(he)電(dian)(dian)(dian)(dian)池組(zu)》、UL 1642：2006《鋰蓄(xu)電(dian)(dian)(dian)(dian)池組(zu)》進行熱濫用（溫(wen)）和(he)熱沖(chong)擊(ji)試驗(yan)項目。

防(fang)爆(bao)高低溫試驗箱滿(man)足標準：

GB/T2423.1～2《電工電子產品的(de)基本環境(jing)試(shi)驗規程試(shi)驗。A：低溫(wen)試(shi)驗方法(fa)、試(shi)驗B：高溫(wen)試(shi)驗方法(fa)》.

GB/T10592-1989高低溫試驗(yan)箱技術條件.

GB/T10589-1989低溫試驗箱(xiang)技術條(tiao)件(jian).

GB/ T 2421-1991《電(dian)工電(dian)子產品(pin)基(ji)本(ben)環境(jing)試驗規程 總(zong)則》.

GB/2423.34-86.MIL-STD883（方法1004.2）高低溫組合循環(huan)試(shi)驗.

GB/T2423.4-93（MIL-STD810）方法507.2程序.

防爆等(deng)級：Exd Ⅱ BT4

GJB/150A-2009.實驗室環境試(shi)驗方法1部分

防爆高低溫試驗箱工作內尺(chi)寸： 　

AP-GD-80 　   W寬40XH高50XD深40cm

AP-GD-120  　 W寬50XH高60XD深40cm

AP-GD-150  　 W寬50XH高60XD深50cm

AP-GD-225  　 W寬(kuan)60XH高75XD深50cm

AP-GD-306  　 W寬(kuan)60XH高(gao)85XD深(shen)60cm

AP-GD-408　   W寬60XH高85XD深80cm

AP-GD-800　   W寬100XH高100XD深80cm

AP-GD-1000 　 W寬(kuan)100XH高100XD深100cm

溫度范(fan)圍 ：0~+150℃/20~+150℃/-40~+150℃/-50~+150℃/-60~+150℃/-70~+150

正(zheng)常升溫(wen)時間 ：+20℃~+150℃小(xiao)于45分鐘(zhong)非線性(xing)空載。

正(zheng)常降溫時間：20~-℃小(xiao)(xiao)于30分(fen)鐘(zhong)(zhong)/+20~-20℃小(xiao)(xiao)于45分(fen)鐘(zhong)(zhong)/+20~-40℃小(xiao)(xiao)于60分(fen)鐘(zhong)(zhong)/+20~-50℃小(xiao)(xiao)于65分(fen)鐘(zhong)(zhong). +20~-60℃小(xiao)(xiao)于70分(fen)鐘(zhong)(zhong)/+20~-70℃小(xiao)(xiao)于75分(fen)鐘(zhong)(zhong)非線(xian)性(xing)空載.

控(kong)制穩定度(du) ： ±0.5℃;分布均勻度(du) ：±2℃

結構：整體(ti)結構為體(ti)式，降溫冷凍(dong)系統(tong)與箱(xiang)體(ti)分開(kai)。

內箱材質：SUS 304# 不銹鋼板

外箱材質：SUS 304#不銹鋼板/特殊(shu)防銹處理冷軋板噴塑烤漆(顏(yan)(yan)色(se)可選(xuan)擇自己喜愛的顏(yan)(yan)色(se)）